Sample holders for multilayers

Sample holders with adjustable preloading force prevent damage to the piezo ceramics in the event of quick large-signal excitations on multilayers.

From hot to ice cold

When it comes to preloading actuators, aixACCT Systems offers solutions for a wide range of tasks. The MLA sample holders employ passive force generation, while the CMA sample holders enable active craft generation when used together with the aixCMA base systems.

We let you perform comprehensive piezo and ferroelectric characterization of your multilayer actuators via measurements at ambient temperatures of -100°C to 300°C.

MLA sample holder – constant loading force

Our MLA sample holders for high-frequency expectations use passive force generation. The preloading is generated via a compression spring. This ensures constant preloading on the actuator during deflection. The actuators are contacted via lateral, spring-mounted testing pins and are centered in the system. Combined with our laser unit, you can determine the length changes in the actuator. Frequencies up to the kHz range are possible depending on type.

MLA sample holders are available for various temperature ranges. They allow simple, reliable and automated measurements.

 

  • Featuring a compact design and replaceable compression springs, the Standard MLA is suitable for the highest frequency range of all systems with preloading force. It can therefore even be used for simply determining the blocking force line.

    Features
    4-point contacting for precise voltage and current measurement on the sample
    Precise and reliable displacement measurements with commercial laser interferometer
    No sample surface polishing required
    Compression springs can be replaced to determine blocking force
    Excitation frequencies > 1 kHz (depending on amplifier)

    4-point contacting for precise voltage and current measurement on the sample

      Precise and reliable displacement measurements with commercial laser interferometer

        No sample surface polishing required

          Compression springs can be replaced to determine blocking force

            Excitation frequencies > 1 kHz (depending on amplifier)

              SPECIFICATIONS
              Sample diameter: at least 2 mm
              Sample length:max. 40 mm
              Other geometries:upon request
              Force:max. up to 10 kN
              Voltage range:max. 400 V

              Sample diameter:

              • at least 2 mm

              Sample length:

              • max. 40 mm

              Other geometries:

              • upon request

              Force:

              • max. up to 10 kN

              Voltage range:

              • max. 400 V

            • The high-temperature version of the MLA sample holder features an integrated heating chamber. This lets you perform measurements at both room temperature and up to 200°C. A special version even allows temperatures of up to 300°C. The preloading force caused by compressing the springs can be set precisely at any time via a digital display.

              Features
              4-point contacting for precise voltage and current measurement on the sample
              Precise and reliable displacement measurements with commercial laser interferometer
              No sample surface polishing required
              Temperature measurement close to the sample
              Enclosed heating chamber for uniform heating
              Insulated housing

              4-point contacting for precise voltage and current measurement on the sample

                Precise and reliable displacement measurements with commercial laser interferometer

                  No sample surface polishing required

                    Temperature measurement close to the sample

                      Enclosed heating chamber for uniform heating

                        Insulated housing

                          SPECIFICATIONS
                          Temperature range: RT–300 °C
                          Probendurchmesser: at least 2 mm
                          Sample length: max. 40 mm
                          Other geometries: upon request
                          Force: max. up to 5 kN
                          Voltage range: up to 400 V

                          Temperature range:

                          • RT–300 °C

                          Probendurchmesser:

                          • at least 2 mm

                          Sample length:

                          • max. 40 mm

                          Other geometries:

                          • upon request

                          Force:

                          • max. up to 5 kN

                          Voltage range:

                          • up to 400 V

                        • This system allows you to perform measurements on multilayer actuators within an expanded temperature range that extends below zero. This feature is particularly interesting for automotive applications, for example.

                          You can choose a variant with circulatory cooling system that covers temperatures down to -40°C, or a version that cools using liquid nitrogen. This version lets you characterize multilayer actuators at temperatures as low as -100°C.

                          Features
                          44-point contacting for precise voltage and current measurement on the sample
                          Precise and reliable displacement measurements with commercial laser interferometer
                          No sample surface polishing required
                          Temperature measurement close to the sample
                          Enclosed heating and cooling chamber
                          Insulated housing

                          44-point contacting for precise voltage and current measurement on the sample

                            Precise and reliable displacement measurements with commercial laser interferometer

                              No sample surface polishing required

                                Temperature measurement close to the sample

                                  Enclosed heating and cooling chamber

                                    Insulated housing

                                      SPECIFICATIONS
                                      Temperature ranges: circulatory cooling system -40 – 200°C; liquid nitrogen -100 – 300°C
                                      Sample diameter: at least 2 mm
                                      Sample length: max. 40 mm
                                      Other geometries: upon request
                                      Force: max. up to 5 kN
                                      Voltage range: up to 400 V

                                      Temperature ranges:

                                      • circulatory cooling system -40 – 200°C; liquid nitrogen -100 – 300°C

                                      Sample diameter:

                                      • at least 2 mm

                                      Sample length:

                                      • max. 40 mm

                                      Other geometries:

                                      • upon request

                                      Force:

                                      • max. up to 5 kN

                                      Voltage range:

                                      • up to 400 V

                                    Dynamic force generation: CMA

                                    If you wish to dynamically vary the preloading force during the measurement, our CMA sample holders offer the perfect solution when combined with the aixCMA base system. Whatever the sample geometry, aixACCT Systems has the right sample holder.

                                    • Would you like to be able to estimate the actual deflection achievable in the component of a MEMS structure under mechanical preloading? That is exactly why we developed the nanoCMA. It is available as a stand-alone variant or as an expansion to your DBLI. The µN precision is achieved by measuring the deflection of a silicon structure using laser interferometry. This is produced by a configurable contact point with the sample.

                                      When combined with the force control system of the CMA, you can apply a defined force to the test structures and dynamically control it. This allows you to simulate the stiffnesses and resulting forces present in the real component. You can record the force-distance curve of the actuator, for example, allowing you to determine stiffness, maximum deflection and blocking force.

                                      A clever combination for many possibilities

                                      Our modular systems can also be combined with the RS module for investigating contact resistance on MEMS circuits. On top of this, the silicon cantilever used to apply the force can be coated with an appropriate contact material. This lets you investigate potential contact material combinations without time-intensive switch processing.

                                      Features
                                      Static and dynamic mechanical force control
                                      µN-level force measurements
                                      Silicon cantilever for contacting small structures
                                      Blocking force and stiffness measurements on MEMS structures
                                      4-point contact for contact resistance measurements

                                      Static and dynamic mechanical force control

                                        µN-level force measurements

                                          Silicon cantilever for contacting small structures

                                            Blocking force and stiffness measurements on MEMS structures

                                              4-point contact for contact resistance measurements

                                                SPECIFICATIONS
                                                Sample sizes: up to 8 inches
                                                Force measurement range:1 mN
                                                Resolution: > 1 µN
                                                Contact point: 20 µm
                                                Voltage range: 400 V

                                                Sample sizes:

                                                • up to 8 inches

                                                Force measurement range:

                                                • 1 mN

                                                Resolution:

                                                • > 1 µN

                                                Contact point:

                                                • 20 µm

                                                Voltage range:

                                                • 400 V

                                              • With our µCMA, you can measure the tiniest multilayer actuators, fibers and fiber compound materials, as well as in bulk materials like small bending actuators. Alongside the precise measurement of large and small-signal characteristics like polarization, large-signal displacement, C(V) or d33, this system also lets you measure blocking force and stiffness on actuators. The µCMA is fitted with high-precision micro-manipulation tables and microscopes, as well as force and distance sensors.

                                                A heating system is available as an optional extra, allowing you to perform measurements in a temperature range of room temperature to 200°C.

                                                Features
                                                mN-level force measurements
                                                Static and dynamic mechanical force control
                                                Precise and reliable displacement measurements with laser interferometer
                                                Positioning and tilting systems for sample and top contact
                                                Special optical process for adjusting plane parallelism
                                                Temperature-based measurements

                                                mN-level force measurements

                                                  Static and dynamic mechanical force control

                                                    Precise and reliable displacement measurements with laser interferometer

                                                      Positioning and tilting systems for sample and top contact

                                                        Special optical process for adjusting plane parallelism

                                                          Temperature-based measurements

                                                            SPECIFICATIONS
                                                            Temperature range: RT-> 200°C (other temperature ranges upon request)
                                                            Sample diameter: at least 0.1 mm as standard (for micro-actuators or fibers)
                                                            Sample table: 50 mm x 100 mm
                                                            Force measurement range: max. 2 N
                                                            Resolution: +/- 5 mN
                                                            Measurement frequency: <10 Hz with clamped probe and defined preloading; up to 100 kHz without preloading of the sample surface
                                                            Sample voltage: max. 300 V (HV optional)

                                                            Temperature range:

                                                            • RT-> 200°C (other temperature ranges upon request)

                                                            Sample diameter:

                                                            • at least 0.1 mm as standard (for micro-actuators or fibers)

                                                            Sample table:

                                                            • 50 mm x 100 mm

                                                            Force measurement range:

                                                            • max. 2 N

                                                            Resolution:

                                                            • +/- 5 mN

                                                            Measurement frequency:

                                                            • <10 Hz with clamped probe and defined preloading; up to 100 kHz without preloading of the sample surface

                                                            Sample voltage:

                                                            • max. 300 V (HV optional)

                                                          • Do you want to measure actuators with a total length of up to 100 mm? Thanks to their large adjustment range and measurement chamber, we offer the right solutions with our standard CMA systems. They offer the highest force range. Depending on the sample, you can apply dynamic forces of several kN. The static strength is 30 kN. As these measurements involve high dynamic forces, the length change in the actuator must be recorded differentially via a double-beam laser system.

                                                            Variable for different sample sizes

                                                            Multilayer, 1-crystal system or bulk materials can be contacted both electrically and mechanically. This lets you characterize bulk materials with top and bottom contacts, with an excitation voltage of up to 10 kV.

                                                            The standard heating chamber, with a temperature range of RT to 200°C, can be expanded to 40°C to 200°C. Here, the temperature is measured on the surface of the actuators by a spring-mounted thermocouple.

                                                            Features
                                                            Measurements taken under controlled static and dynamic mechanical load
                                                            Contacting via side or end surfaces
                                                            Precise and reliable displacement measurements with commercial double-beam laser interferometer
                                                            Temperature measurement on the sample
                                                            No sample surface polishing required
                                                            Electrical polarization and displacement measurements (uni and bipolar)
                                                            Measurements of small signal capacity, loss factor and piezo coefficient via uni and bipolar bias voltages
                                                            Measurements of blocking force, stiffness, charge, displacement and polarization vs. force
                                                            Leakage current measurements
                                                            Fatigue measurements (mechanical and electrical excitation)
                                                            Temperature-based measurements

                                                            Measurements taken under controlled static and dynamic mechanical load

                                                              Contacting via side or end surfaces

                                                                Precise and reliable displacement measurements with commercial double-beam laser interferometer

                                                                  Temperature measurement on the sample

                                                                    No sample surface polishing required

                                                                      Electrical polarization and displacement measurements (uni and bipolar)

                                                                        Measurements of small signal capacity, loss factor and piezo coefficient via uni and bipolar bias voltages

                                                                          Measurements of blocking force, stiffness, charge, displacement and polarization vs. force

                                                                            Leakage current measurements

                                                                              Fatigue measurements (mechanical and electrical excitation)

                                                                                Temperature-based measurements

                                                                                  Specifications
                                                                                  Static preload: up to 30 kN
                                                                                  Dynamic force generation: up to 6 kN
                                                                                  Temperature range: RT-> 200°C or -40–200°C (with cooling option); other temperature ranges upon request
                                                                                  Temperature resolution: 0,1 °C
                                                                                  Sample thickness: lateral contacting 5–100 mm, top/bottom 0.1–100 mm
                                                                                  Sample diameter: 2–25 mm

                                                                                  Static preload:

                                                                                  • up to 30 kN

                                                                                  Dynamic force generation:

                                                                                  • up to 6 kN

                                                                                  Temperature range:

                                                                                  • RT-> 200°C or -40–200°C (with cooling option); other temperature ranges upon request

                                                                                  Temperature resolution:

                                                                                  • 0,1 °C

                                                                                  Sample thickness:

                                                                                  • lateral contacting 5–100 mm, top/bottom 0.1–100 mm

                                                                                  Sample diameter:

                                                                                  • 2–25 mm

                                                                                Would you like to know more?

                                                                                Have you not found the right sample holder in our portfolio for your specific application? Maybe you would like to know more about the options that our innovative sample holders can offer? If this is the case, get in touch. We have the experience required to develop the right customized solution for you.