From hot to ice cold
When it comes to preloading actuators, aixACCT Systems offers solutions for a wide range of tasks. The MLA sample holders employ passive force generation, while the CMA sample holders enable active craft generation when used together with the aixCMA base systems.
We let you perform comprehensive piezo and ferroelectric characterization of your multilayer actuators via measurements at ambient temperatures of -100°C to 300°C.
MLA sample holder – constant loading force
Our MLA sample holders for high-frequency expectations use passive force generation. The preloading is generated via a compression spring. This ensures constant preloading on the actuator during deflection. The actuators are contacted via lateral, spring-mounted testing pins and are centered in the system. Combined with our laser unit, you can determine the length changes in the actuator. Frequencies up to the kHz range are possible depending on type.
MLA sample holders are available for various temperature ranges. They allow simple, reliable and automated measurements.
-  Featuring a compact design and replaceable compression springs, the Standard MLA is suitable for the highest frequency range of all systems with preloading force. It can therefore even be used for simply determining the blocking force line. Features4-point contacting for precise voltage and current measurement on the sample Precise and reliable displacement measurements with commercial laser interferometer No sample surface polishing required Compression springs can be replaced to determine blocking force Excitation frequencies > 1 kHz (depending on amplifier) 4-point contacting for precise voltage and current measurement on the samplePrecise and reliable displacement measurements with commercial laser interferometerNo sample surface polishing requiredCompression springs can be replaced to determine blocking forceExcitation frequencies > 1 kHz (depending on amplifier)SPECIFICATIONSSample diameter: at least 2 mm Sample length: max. 40 mm Other geometries: upon request Force: max. up to 10 kN Voltage range: max. 400 V Sample diameter:- at least 2 mm 
 Sample length:- max. 40 mm 
 Other geometries:- upon request 
 Force:- max. up to 10 kN 
 Voltage range:- max. 400 V 
 
-  The high-temperature version of the MLA sample holder features an integrated heating chamber. This lets you perform measurements at both room temperature and up to 200°C. A special version even allows temperatures of up to 300°C. The preloading force caused by compressing the springs can be set precisely at any time via a digital display. Features4-point contacting for precise voltage and current measurement on the sample Precise and reliable displacement measurements with commercial laser interferometer No sample surface polishing required Temperature measurement close to the sample Enclosed heating chamber for uniform heating Insulated housing 4-point contacting for precise voltage and current measurement on the samplePrecise and reliable displacement measurements with commercial laser interferometerNo sample surface polishing requiredTemperature measurement close to the sampleEnclosed heating chamber for uniform heatingInsulated housingSPECIFICATIONSTemperature range: RT–300 °C Probendurchmesser: at least 2 mm Sample length: max. 40 mm Other geometries: upon request Force: max. up to 5 kN Voltage range: up to 400 V Temperature range:- RT–300 °C 
 Probendurchmesser:- at least 2 mm 
 Sample length:- max. 40 mm 
 Other geometries:- upon request 
 Force:- max. up to 5 kN 
 Voltage range:- up to 400 V 
 
-  This system allows you to perform measurements on multilayer actuators within an expanded temperature range that extends below zero. This feature is particularly interesting for automotive applications, for example. You can choose a variant with circulatory cooling system that covers temperatures down to -40°C, or a version that cools using liquid nitrogen. This version lets you characterize multilayer actuators at temperatures as low as -100°C. Features44-point contacting for precise voltage and current measurement on the sample Precise and reliable displacement measurements with commercial laser interferometer No sample surface polishing required Temperature measurement close to the sample Enclosed heating and cooling chamber Insulated housing 
 44-point contacting for precise voltage and current measurement on the samplePrecise and reliable displacement measurements with commercial laser interferometerNo sample surface polishing requiredTemperature measurement close to the sampleEnclosed heating and cooling chamberInsulated housingSPECIFICATIONSTemperature ranges: circulatory cooling system -40 – 200°C; liquid nitrogen -100 – 300°C Sample diameter: at least 2 mm Sample length: max. 40 mm Other geometries: upon request Force: max. up to 5 kN Voltage range: up to 400 V Temperature ranges:- circulatory cooling system -40 – 200°C; liquid nitrogen -100 – 300°C 
 Sample diameter:- at least 2 mm 
 Sample length:- max. 40 mm 
 Other geometries:- upon request 
 Force:- max. up to 5 kN 
 Voltage range:- up to 400 V 
 
Dynamic force generation: CMA
If you wish to dynamically vary the preloading force during the measurement, our CMA sample holders offer the perfect solution when combined with the aixCMA base system. Whatever the sample geometry, aixACCT Systems has the right sample holder.
-  Would you like to be able to estimate the actual deflection achievable in the component of a MEMS structure under mechanical preloading? That is exactly why we developed the nanoCMA. It is available as a stand-alone variant or as an expansion to your DBLI. The µN precision is achieved by measuring the deflection of a silicon structure using laser interferometry. This is produced by a configurable contact point with the sample. When combined with the force control system of the CMA, you can apply a defined force to the test structures and dynamically control it. This allows you to simulate the stiffnesses and resulting forces present in the real component. You can record the force-distance curve of the actuator, for example, allowing you to determine stiffness, maximum deflection and blocking force. A clever combination for many possibilitiesOur modular systems can also be combined with the RS module for investigating contact resistance on MEMS circuits. On top of this, the silicon cantilever used to apply the force can be coated with an appropriate contact material. This lets you investigate potential contact material combinations without time-intensive switch processing. FeaturesStatic and dynamic mechanical force control µN-level force measurements Silicon cantilever for contacting small structures Blocking force and stiffness measurements on MEMS structures 4-point contact for contact resistance measurements Static and dynamic mechanical force controlµN-level force measurementsSilicon cantilever for contacting small structuresBlocking force and stiffness measurements on MEMS structures4-point contact for contact resistance measurementsSPECIFICATIONSSample sizes: up to 8 inches Force measurement range: 1 mN Resolution: > 1 µN Contact point: 20 µm Voltage range: 400 V Sample sizes:- up to 8 inches 
 Force measurement range:- 1 mN 
 Resolution:- > 1 µN 
 Contact point:- 20 µm 
 Voltage range:- 400 V 
 
-  With our µCMA, you can measure the tiniest multilayer actuators, fibers and fiber compound materials, as well as in bulk materials like small bending actuators. Alongside the precise measurement of large and small-signal characteristics like polarization, large-signal displacement, C(V) or d33, this system also lets you measure blocking force and stiffness on actuators. The µCMA is fitted with high-precision micro-manipulation tables and microscopes, as well as force and distance sensors. A heating system is available as an optional extra, allowing you to perform measurements in a temperature range of room temperature to 200°C. FeaturesmN-level force measurements Static and dynamic mechanical force control Precise and reliable displacement measurements with laser interferometer Positioning and tilting systems for sample and top contact Special optical process for adjusting plane parallelism Temperature-based measurements mN-level force measurementsStatic and dynamic mechanical force controlPrecise and reliable displacement measurements with laser interferometerPositioning and tilting systems for sample and top contactSpecial optical process for adjusting plane parallelismTemperature-based measurementsSPECIFICATIONSTemperature range: RT-> 200°C (other temperature ranges upon request) Sample diameter: at least 0.1 mm as standard (for micro-actuators or fibers) Sample table: 50 mm x 100 mm Force measurement range: max. 2 N Resolution: +/- 5 mN Measurement frequency: <10 Hz with clamped probe and defined preloading; up to 100 kHz without preloading of the sample surface Sample voltage: max. 300 V (HV optional) 
 Temperature range:- RT-> 200°C (other temperature ranges upon request) 
 Sample diameter:- at least 0.1 mm as standard (for micro-actuators or fibers) 
 Sample table:- 50 mm x 100 mm 
 Force measurement range:- max. 2 N 
 Resolution:- +/- 5 mN 
 Measurement frequency:- <10 Hz with clamped probe and defined preloading; up to 100 kHz without preloading of the sample surface 
 Sample voltage:- max. 300 V (HV optional) 
 
 
-  Do you want to measure actuators with a total length of up to 100 mm? Thanks to their large adjustment range and measurement chamber, we offer the right solutions with our standard CMA systems. They offer the highest force range. Depending on the sample, you can apply dynamic forces of several kN. The static strength is 30 kN. As these measurements involve high dynamic forces, the length change in the actuator must be recorded differentially via a double-beam laser system. Variable for different sample sizesMultilayer, 1-crystal system or bulk materials can be contacted both electrically and mechanically. This lets you characterize bulk materials with top and bottom contacts, with an excitation voltage of up to 10 kV. The standard heating chamber, with a temperature range of RT to 200°C, can be expanded to 40°C to 200°C. Here, the temperature is measured on the surface of the actuators by a spring-mounted thermocouple. FeaturesMeasurements taken under controlled static and dynamic mechanical load Contacting via side or end surfaces Precise and reliable displacement measurements with commercial double-beam laser interferometer Temperature measurement on the sample No sample surface polishing required Electrical polarization and displacement measurements (uni and bipolar) Measurements of small signal capacity, loss factor and piezo coefficient via uni and bipolar bias voltages Measurements of blocking force, stiffness, charge, displacement and polarization vs. force Leakage current measurements Fatigue measurements (mechanical and electrical excitation) Temperature-based measurements Measurements taken under controlled static and dynamic mechanical loadContacting via side or end surfacesPrecise and reliable displacement measurements with commercial double-beam laser interferometerTemperature measurement on the sampleNo sample surface polishing requiredElectrical polarization and displacement measurements (uni and bipolar)Measurements of small signal capacity, loss factor and piezo coefficient via uni and bipolar bias voltagesMeasurements of blocking force, stiffness, charge, displacement and polarization vs. forceLeakage current measurementsFatigue measurements (mechanical and electrical excitation)Temperature-based measurementsSpecificationsStatic preload: up to 30 kN Dynamic force generation: up to 6 kN Temperature range: RT-> 200°C or -40–200°C (with cooling option); other temperature ranges upon request Temperature resolution: 0,1 °C Sample thickness: lateral contacting 5–100 mm, top/bottom 0.1–100 mm Sample diameter: 2–25 mm Static preload:- up to 30 kN 
 Dynamic force generation:- up to 6 kN 
 Temperature range:- RT-> 200°C or -40–200°C (with cooling option); other temperature ranges upon request 
 Temperature resolution:- 0,1 °C 
 Sample thickness:- lateral contacting 5–100 mm, top/bottom 0.1–100 mm 
 Sample diameter:- 2–25 mm 
 
Would you like to know more?
Have you not found the right sample holder in our portfolio for your specific application? Maybe you would like to know more about the options that our innovative sample holders can offer? If this is the case, get in touch. We have the experience required to develop the right customized solution for you.
 
  
  
  
  
  
  
  
  
  
 