PSHU sample holder – today’s benchmark
When characterizing bulk materials, the combination of our PSHU sample holder and PES measuring system has become today’s benchmark. The basic version alone is already in use at over 120 industrial customers. Working in close collaboration with our customers, we have continuously modified this sample holder for over a decade. Today, it is available in a variety of versions, including for measurements in temperatures ranging from -100°C to 600°C.
Each variant offers specific advantages, from standard to PSHU HT for characterizing high-temperature materials as well as the PSHU Kryo for piezoelectric measurements in a temperature cycle.
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The basic variant of the PSHU as already proven itself over the last 15 years. Throughout this time, we have continuously improved the sample holder. The standard model allows you to determine piezo coefficients under temperature, and this process can be automated in combination with our laser systems.
All of our PSHU sample holders are easy to use, enabling reproducible results regardless of operator.
Features
Special top electrode ensures reliable and precise displacement measurements with commercial laser interferometer Large working range and distance to the sensor head compared to intensity-based length measurement systems Can be used with silicon oil to increase breakdown voltage Temperature measurement close to the sample Special top electrode ensures reliable and precise displacement measurements with commercial laser interferometer
Large working range and distance to the sensor head compared to intensity-based length measurement systems
Can be used with silicon oil to increase breakdown voltage
Temperature measurement close to the sample
SPECIFICATIONS
Temperature: max. 250°C (temperature measurement on sample) Sample thickness: 0,1–10 mm Sample diameter: 3–25 mm Voltage: max. 10 kV Temperature:
max. 250°C (temperature measurement on sample)
Sample thickness:
0,1–10 mm
Sample diameter:
3–25 mm
Voltage:
max. 10 kV
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The PSHU HT sample holder lets you reliably characterize piezoelectric high-temperature materials. Featuring an expanded temperature range compared to the standard PSHU, it is perfect for this purpose and allows you to perform automated piezoelectric measurements throughout the entire temperature range.
We can proudly say that the aixPES with PSHU HT sample holder is the only commercially available measurement system that lets you measure both current (polarization) and displacement simultaneously.
Features
Can be used with flushing gas Verwendung von Spülgas möglich Contacting of samples for current measurements with the virtual earth method ZPrecise and reliable displacement measurements with commercial laser interferometer Special top electrode contact for use with laser interferometer Temperature measurement close to the sample Connections for dry air or nitrogen circulation Can be used with flushing gas Verwendung von Spülgas möglich
Contacting of samples for current measurements with the virtual earth method
ZPrecise and reliable displacement measurements with commercial laser interferometer
Special top electrode contact for use with laser interferometer
Temperature measurement close to the sample
Connections for dry air or nitrogen circulation
Specifications
Temperature range: room temperature up to max. 600 °C Heating rate: 100°C/min Sample thickness: 0,3–10 mm Sample diameter: 3–25 mm Voltage range: up to 10 kV Temperature range:
room temperature up to max. 600 °C
Heating rate:
100°C/min
Sample thickness:
0,3–10 mm
Sample diameter:
3–25 mm
Voltage range:
up to 10 kV
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If you need to perform automated piezoelectric measurements with high precision in a temperature cycle, aixACCT Systems offers the only commercially available measurement system for this purpose.
In the most advanced expansion stage of our PSHU series, the temperature range has been extended to -100°C to 600°C. Given the new requirements for sensor or actuator applications, this lets you investigate new material compositions in an enormous temperature range.
Features
Can be used with flushing gas Precise and reliable displacement measurements with commercial laser interferometer Special top electrode contact for use with laser interferometer Dewar vessel for liquid nitrogen Connections for dry air or nitrogen circulation
Can be used with flushing gas
Precise and reliable displacement measurements with commercial laser interferometer
Special top electrode contact for use with laser interferometer
Dewar vessel for liquid nitrogen
Connections for dry air or nitrogen circulation
SPECIFICATIONS
Temperature range: -100–600°C (temperature measurement close to the sample) Heating rate: 100 °C/min Cooling rate: 3°C/min Sample thickness: 0,3–10 mm Sample diameter: 3–25 mm Voltage range: up to 10 kV Temperature range:
-100–600°C (temperature measurement close to the sample)
Heating rate:
100 °C/min
Cooling rate:
3°C/min
Sample thickness:
0,3–10 mm
Sample diameter:
3–25 mm
Voltage range:
up to 10 kV
The all-rounder: Bulk/CMA
The Bulk/CMA sample holder is suitable for a wide range of different materials and sample geometries. It allows you to measure bulk, multilayer and even polymers.
Thanks to a series of contact options, you can measure both various sample displacement directions (d33, d31, etc.) and sample thicknesses (0.1 mm to 30 mm). On top of this, you can also perform measurements in different temperature ranges.
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Features
Top and bottom contacting, or with side contacts or wired samples Samples can be clamped between height-adjustable point contacts Precise and reliable displacement measurements with commercial laser interferometer Large working range and distance to the sensor head compared to intensity-based displacement measuring systems No sample surface polishing required Temperature measurement on the sample (ambient temperature) Top and bottom contacting, or with side contacts or wired samples
Samples can be clamped between height-adjustable point contacts
Precise and reliable displacement measurements with commercial laser interferometer
Large working range and distance to the sensor head compared to intensity-based displacement measuring systems
No sample surface polishing required
Temperature measurement on the sample (ambient temperature)
Specifications
Temperature range: RT-> 250°C or 400°C; with cooling option: -100°C–250°C (400°C Sample thickness 0,1–30 mm Sample diameter:
2–20 mm Other geometries:
on request Voltage range: up to +/- 10 kV Temperature range:
RT-> 250°C or 400°C; with cooling option: -100°C–250°C (400°C
Sample thickness
0,1–30 mm
Sample diameter:
2–20 mm
Other geometries:
on request
Voltage range:
up to +/- 10 kV
