advanced customized characterization technology

 
Product World MEMS Products
aixPlorer aixPlorer

Management and advanced analysis for application of measurement data

  Application

Extracting of additional characteristic values for FeRAM and sensors and actuators
  • Parameter tracking for FeRAM applications, for example memory window parameter calculation of ferroelectric thin films
  • Coefficient tracking for sensor and actuator applications, for example piezoelectric coupling coefficient or electro-mechanical hysteresis
  Performance
  • Sophisticated assistance for users of aixACCT measurement systems
  • Browsing of measurement data directories
  • File content overview
  • View measurement details for presentation and reports
  • Multiple measurement comparison
  • Optional database connection (ODBC) for easy access on material / device characteristics

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